Semiconductor testing is a core link that runs through the entire semiconductor industry chain, encompassing chip design, wafer manufacturing, and packaging processes to ensure product yield. During chip testing, ESD test metrics serve as a key indicator reflecting chip reliability.
ESD stands for Electro-Static Discharge, which means static electricity discharge. Static electricity is characterized by high voltage, low charge, small current, and short duration. In electronic devices, as manufacturing processes become increasingly advanced, miniature electronic components and chips may be severely affected by significant ESD events. Even the smallest static discharge can now cause fatal damage to these components, leading to performance degradation or complete failure. Therefore, to ensure the reliability and stability of equipment, conducting ESD testing for chips is essential. The purpose of ESD testing is to evaluate a chip's resistance to static electricity discharge, ensuring that it remains undamaged when exposed to ESD events during production, within the agreed-upon standard range.
Electrostatic discharge generator
Test stand
ESD failure lid opening analysis
ESD Failure Thermal Imaging Analysis
